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KIAM Preprint № 139, Moscow, 2016
Authors: Popkov K. A.
Lower bounds on lengths of single tests for logic circuits
Nontrivial lower bounds on lengths of the minimal single fault detection and diagnostic tests for logic circuits in wide classes of bases in presence of one-type or arbitrary constant faults on outputs of gates are obtained.
logic circuit, fault, single fault detection test, single diagnostic test
Publication language: russian,  pages: 20
Research direction:
Mathematical modelling in actual problems of science and technics
Russian source text:
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About authors:
  • Popkov Kirill Andreevich, RAS