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KIAM Preprint № 139, Moscow, 2016
Authors: Popkov K. A.
Lower bounds on lengths of single tests for logic circuits
Abstract:
Nontrivial lower bounds on lengths of the minimal single fault detection and diagnostic tests for logic circuits in wide classes of bases in presence of one-type or arbitrary constant faults on outputs of gates are obtained.
Keywords:
logic circuit, fault, single fault detection test, single diagnostic test
Publication language: russian,  pages: 20
Research direction:
Mathematical modelling in actual problems of science and technics
Russian source text:
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