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KIAM Preprint ¹ 80, Moscow, 2007
Authors: Zhukovsky M. E., Skachkov M.V.
Statistical Models of Electron Emission. “Thickened Paths” Model
Abstract:
The present paper is devoted to the description of statistical models of electron transport in substance and their realization while solving problems on electron emission from the surface of the objects irradiated by ionizing radiation. The main attention is paid to the description of new “thickened paths” model (MTP). Advantage of new model of the existing ones is in refusal to use approximate distributions of multiple scattering theory in keeping effectiveness of calculations. The work also presents the simplified engineering model of electron emission from the surface of the object under ionizing radiation. This model is less accurate compared to MTP; however its advantage is calculating rapidity.
Publication language: russian,  pages: 26
Research direction:
Mathematical modelling in actual problems of science and technics
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About authors:
  • Zhukovsky Mikhail Evgenievich,  orcid.org/0000-0001-5886-3026KIAM RAS
  • Skachkov M V,  KIAM RAS