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KIAM Preprint № 41, Moscow, 2007
Authors: Kartashev V. A., Kartashev V.V.
Investigation of STM tip motion relatively surface
Abstract:
The picture of surface relief received from tunnel microscope depends on diameter of its probe tip. Geometrical aspects of this dependence are investigated. The algorithm for reconstructing real geometry of surface is proposed.
Keywords:
Nanotechnology, correction of surface image subject to curvature of STM tip
Publication language: russian,  страниц: 12
Research direction:
Mathematical modelling in actual problems of science and technics
Russian source text:
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