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KIAM Preprint № 88, Moscow, 2004
Authors: Buruhina T.F., Kartashev V. A.
Dependence of Tip Displacements from Inclining of Tunnel Microscope Body
Abstract:
Dependence between tip displacements of STM and inclining of its axis is investigated. This dependence should be taken into account on the stage of designing of STM and in interpretation of measurements. Experiments confirm existing of the dependence and appropriateness of used theoretical models.
Keywords:
Scanning probe tunnel microscope, sensitivity to disturbances
Publication language: russian,  страниц: 25
Research direction:
Mathematical modelling in actual problems of science and technics
Russian source text:
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