Complete fault detection tests of the length two for logic networks under stuck-at faults of gates
Abstract:
We consider a problem of synthesis of logic networks implementing Boo lean functions on n variables and allowing short complete fault detection tests regarding arbitrary stuck-at faults on outputs of gates. It is proved that there exists a basis consisting of two Boolean functions not more than on four variables, in which one can implement any Boolean function by a network allowing such a test with a length not exceeding 2.
Keywords:
logic network, stuck-at fault, complete fault detection test
Publication language:russian, pages:16
Research direction:
Mathematical modelling in actual problems of science and technics
