On single diagnostic tests for logic circuits in the Zhegalkin basis
Abstract:
We consider a problem of synthesis of irredundant logic circuits in the basis {&,⊕,1,0} which implement Boolean functions on n variables and allow short single diagnostic tests regarding constant faults of type 0 at outputs of gates. For each Boolean function, the minimal possible length value of such a test is found. In particular, it is proved that this value does not exceed two.
Keywords:
logic circuit, fault, single diagnostic test
Publication language:russian, pages:16
Research direction:
Mathematical modelling in actual problems of science and technics
