Lower bounds on lengths of single tests for logic circuits
Abstract:
Nontrivial lower bounds on lengths of the minimal single fault detection and diagnostic tests for logic circuits in wide classes of bases in presence of one-type or arbitrary constant faults on outputs of gates are obtained.
Keywords:
logic circuit, fault, single fault detection test, single diagnostic test
Publication language:russian, pages:20
Research direction:
Mathematical modelling in actual problems of science and technics
