Conference material: "Academician O.B. Lupanov XIV International Scientific Seminar "Discrete Mathematics and Its Applications" (20-25 June 2022, Moscow)"
Authors:Albek M.K., Romanov D.S.
On dyagnostic tests for mirror reflections of circuit inputs
Abstract:
A single local mirror reflection of circuit inputs is understood as a malfunction consisting in the fact that within a certain segment consecutive inputs of the circuit, the order of the inputs of the circuit changes to opposite. With multiple local mirror reflections of the inputs scheme, the source of faults is chosen by an arbitrary number pairwise non-intersecting segments of consecutive inputs of the circuit, in each of which the order of the inputs of the circuit changes to opposite. The paper establishes the order of growth of the Shannon function length of a single diagnostic test relative to local mirror reflections of circuit inputs, as well as nontrivial evaluation of the Shannon function of the length of the complete diagnostic test with respect to local mirror reflections of circuit inputs.
