Русский
K. A. Popkov
Lower bounds on lengths of complete diagnostic tests for circuits and inputs of circuits
Keldysh Institute Preprints. 2016. № 60. Pages: 12. Language: russian
Citations in Crossref: 2
Article
K.A. Popkov
Complete fault detection tests of the length two for logic networks under stuck-at faults of gates
Publisher: Keldysh Institute Preprints, 2017, Issue 104, Page 1
Citations: 2
Article
K.A. Popkov
Short single tests for logic networks under arbitrary stuck-at faults at outputs of gates
Publisher: Keldysh Institute Preprints, 2018, Issue 33, Page 1
Citations: 1