KIAM Main page Web Library  •  Publication Searh  Ðóññêèé 
Publications
Popkov Kirill Andreevich
Email:
ORCID: 0000-0003-3763-4050

2022 year
1.  Conference material, 2022
Authors: Popkov K.A.
Title: Short full diagnostic tests for single-type constant faults on gate outputs

2021 year
2.  KIAM Preprint ¹ 49, Moscow, 2021
Authors: Popkov K.A.
Title: On self-correcting logic circuits of unreliable gates

2019 year
3.  KIAM Preprint ¹ 81, Moscow, 2019
Authors: Popkov K. A.
Title: A method of construction of easily diagnosable logic networks regarding single faults

2018 year
4.  KIAM Preprint ¹ 271, Moscow, 2018
Authors: Popkov K. A.
Title: On diagnostic tests of contact break for contact circuits

2018 year
5.  KIAM Preprint ¹ 197, Moscow, 2018
Authors: Popkov K. A.
Title: Short complete fault detection tests for logic networks with fan-in two

2018 year
6.  KIAM Preprint ¹ 161, Moscow, 2018
Authors: Popkov K. A.
Title: Minimal complete fault detection tests for logic networks in the standard basis

2018 year
7.  KIAM Preprint ¹ 149, Moscow, 2018
Authors: Popkov K. A.
Title: Synthesis of easily testable logic networks under arbitrary stuck-at faults at inputs and outputs of gates

2018 year
8.  KIAM Preprint ¹ 87, Moscow, 2018
Authors: Popkov K. A.
Title: Synthesis of easily testable logic networks under one-type stuck-at faults at inputs and outputs of gates

2018 year
9.  KIAM Preprint ¹ 33, Moscow, 2018
Authors: Popkov K. A.
Title: Short single tests for logic networks under arbitrary stuck-at faults at outputs of gates

2017 year
10.  KIAM Preprint ¹ 105, Moscow, 2017
Authors: Popkov K. A.
Title: Complete diagnostic tests of the length two for logic networks under inverse faults of logic gates

2017 year
11.  KIAM Preprint ¹ 104, Moscow, 2017
Authors: Popkov K. A.
Title: Complete fault detection tests of the length two for logic networks under stuck-at faults of gates

2017 year
12.  KIAM Preprint ¹ 30, Moscow, 2017
Authors: Popkov K. A.
Title: Single fault detection tests for logic networks in the basis “conjunction-negation”

2016 year
13.  KIAM Preprint ¹ 139, Moscow, 2016
Authors: Popkov K. A.
Title: Lower bounds on lengths of single tests for logic circuits

2016 year
14.  KIAM Preprint ¹ 60, Moscow, 2016
Authors: Popkov K. A.
Title: Lower bounds on lengths of complete diagnostic tests for circuits and inputs of circuits

2016 year
15.  KIAM Preprint ¹ 50, Moscow, 2016
Authors: Popkov K. A.
Title: On single diagnostic tests for logic circuits in the Zhegalkin basis

2016 year
16.  KIAM Preprint ¹ 14, Moscow, 2016
Authors: Popkov K. A.
Title: On tests of contact closure for contact circuits

2015 year
17.  KIAM Preprint ¹ 74, Moscow, 2015
Authors: Popkov K. A.
Title: On an exact length value of a minimal single diagnostic test for one class of circuits