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KIAM Preprint № 87, Moscow, 2018
Authors: Popkov K.A.
Synthesis of easily testable logic networks under one-type stuck-at faults at inputs and outputs of gates
The following assertions are proved: for each natural k and each Boolean constant p, there exists a basis consisting of a Boolean function on max(k+1; 3) variables and negation of one variable (there exists a basis consisting of a Boolean function on not more than 2,5k+2 variables and negation of this function), in which one can implement any Boolean function except a Boolean constant p by a logic network which is irredundant and allows a fault detection test (a diagnostic test, respectively) with a length not exceeding 2 under not more than k stuck-at-p faults at inputs and outputs of gates. It is shown that, when considering only stuck-at-p faults at inputs of gates, one can reduce the mentioned bounds on lengths of tests to 1.
logic network, one-type stuck-at fault, fault detection test, diagnostic test
Publication language: russian, pages: 18
Research direction:
Mathematical modelling in actual problems of science and technics
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