Synthesis of easily testable logic networks under one-type stuck-at faults at inputs and outputs of gates

Abstract:

The following assertions are proved: for each natural k and each Boolean constant p, there exists a basis consisting of a Boolean function on max(k+1; 3) variables and negation of one variable (there exists a basis consisting of a Boolean function on not more than 2,5k+2 variables and negation of this function), in which one can implement any Boolean function except a Boolean constant p by a logic network which is irredundant and allows a fault detection test (a diagnostic test, respectively) with a length not exceeding 2 under not more than k stuck-at-p faults at inputs and outputs of gates. It is shown that, when considering only stuck-at-p faults at inputs of gates, one can reduce the mentioned bounds on lengths of tests to 1.

Keywords:

logic network, one-type stuck-at fault, fault detection test, diagnostic test

Publication language:russian,
pages:18

Research direction:

Mathematical modelling in actual problems of science and technics