Single fault detection tests for logic networks in the basis “conjunction-negation”

Abstract:

We consider a problem of synthesis of irredundant logic networks in the basis {&,¬} and similar bases which implement Boolean functions on n variables and allow short single fault detection tests regarding stuck-at-1 or stuck-an-0 faults on outputs of gates. For each Boolean function permitting implementation by an irredundant circuit, the minimal possible length value of such a test is found. In particular, it is proved that this value does not exceed three.

Keywords:

logic network, stuck-at fault, single fault detection test

Publication language:russian,
pages:31

Research direction:

Mathematical modelling in actual problems of science and technics