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KIAM Preprint № 87, Moscow, 2004
Authors: Buruhina T.F., Kartashev V. A.
Dependence of Tip Displacements from Nonresonance Oscillations of Tunnel Microscope Basis
Dependence of STM tip position from nonresonance oscillations of work table is under investigation. Necessity of investigation is explained by small value of tunnel gap (about 1 um) between tip and surface. It is achieved that dependence take place because of STM structure sags under gravity and microscope axis bounces in respond of oscillations of table. On low frequencies this effect is ten times more then translation oscillations of microscope body which traditionally taken into account in estimation of external disturbances.
scanning probe tunnel microscope, small oscillations, sensitivity to disturbance
Publication language: russian, pages: 20
Research direction:
Mathematical modelling in actual problems of science and technics
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